Application notes

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Basic techniques and recommended types of cantilevers and for different SPM applications.  Contact AFM mode Topography imaging: Contact mode. Ambient air and fluids.  Noncontact AFM mode Topography imaging: Noncontact mode. Vacuum conditions.  Intermittent contact (Tapping) mode Topography imaging: Intermittent contact (Tapping) mode. Ambient air and fluids.  High Resolution Imaging Topography imaging: Measuring features at the nanoscale using HI'RES probe.  Phase imaging Material - Sensitive Contrast: Phase imaging.  Force Modulation Material - Sensitive Contrast: Force Modulation.

Lateral Force Microscopy Material - Sensitive Contrast: Lateral Force Microscopy.  Force Curves Analysis Material - Sensitive SPM Techniques: Force Curves Analysis and Force Volume Imaging.  Electric properties: Two-Pass modes Dynamic SPM modes for mapping of electric properties of materials.  Electric properties: Contact modes Scanning Spreading Resistance Microscopy (SSRM), Scanning Capacitance Microscopy (SCM), etc.  Electrochemical SPM Study of the electronic properties and structure of electrodes and changes caused by chemical and electrochemical processes.  Magnetic Force Microscopy Two-pass techniques for the study of the magnetic properties.

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