Most of the SPM researches are not controllable
by any other measurement technique due to the small dimensions
and specific structure of the objects. This makes the problem
of accuracy and reliability of SPM results very important.
ULTRASHARP calibration gratings are specialized for detection
of artefacts of Atomic Force Microscopes.
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Creep detection |
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| Detection of image distortions
caused by creep of piezoceramics. |
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Nonlinearity |
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| Assessment and compensation
of vertical and lateral nonlinearity. |
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Tip characterization |
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| SPM tip degradation and contamination
control by means of the deconvolution procedure. |
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